Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross ; EDFAS, ASM International.

ISBN:

9781613447598

9781615037261

Title:

Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross ; EDFAS, ASM International.

Author:

Ross, Richard J.

Edition:

6th ed.

Publication Information:

Physical Description:

1 online resource (xi, 660 pages) : illustrations

General Note:

"ASM International, 2011, no. 09110Z"--Page 4 of cover.

Some online versions lack accompanying media packaged with the printed version.

Contents:

Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.

Local Note:

eBooks on EBSCOhost

Subject Term:

Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.

Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc.

Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.

Electronics -- Materials -- Testing -- Handbooks, manuals, etc.

Electronics -- Materials -- Defects -- Handbooks, manuals, etc.

Added Author:

Ross, Richard J.

Added Corporate Author:

ASM International.